Datasheets
NDT3055L by:

3.7A, 60V, 0.12ohm, N-CHANNEL, Si, POWER, MOSFET, TO-261

Part Details for NDT3055L by Texas Instruments

Results Overview of NDT3055L by Texas Instruments

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NDT3055L Information

NDT3055L by Texas Instruments is a Power Field-Effect Transistor.
Power Field-Effect Transistors are under the broader part category of Transistors.

A transistor is a small semiconductor device used to amplify, control, or create electrical signals. When selecting a transistor, factors such as voltage, current rating, gain, and power dissipation must be considered, with common types. Read more about Transistors on our Transistors part category page.

Part Details for NDT3055L

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NDT3055L Part Data Attributes

NDT3055L Texas Instruments
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NDT3055L Texas Instruments 3.7A, 60V, 0.12ohm, N-CHANNEL, Si, POWER, MOSFET, TO-261
Rohs Code No
Part Life Cycle Code Transferred
Ihs Manufacturer NATIONAL SEMICONDUCTOR CORP
Package Description SMALL OUTLINE, R-PDSO-G4
Reach Compliance Code unknown
ECCN Code EAR99
HTS Code 8541.29.00.95
Additional Feature LOGIC LEVEL COMPATIBLE
Case Connection DRAIN
Configuration SINGLE WITH BUILT-IN DIODE
DS Breakdown Voltage-Min 60 V
Drain Current-Max (ID) 3.7 A
Drain-source On Resistance-Max 0.12 Ω
FET Technology METAL-OXIDE SEMICONDUCTOR
JEDEC-95 Code TO-261
JESD-30 Code R-PDSO-G4
JESD-609 Code e0
Number of Elements 1
Number of Terminals 4
Operating Mode ENHANCEMENT MODE
Operating Temperature-Max 150 °C
Package Body Material PLASTIC/EPOXY
Package Shape RECTANGULAR
Package Style SMALL OUTLINE
Polarity/Channel Type N-CHANNEL
Power Dissipation Ambient-Max 1.1 W
Power Dissipation-Max (Abs) 3 W
Pulsed Drain Current-Max (IDM) 25 A
Qualification Status Not Qualified
Surface Mount YES
Terminal Finish Tin/Lead (Sn/Pb)
Terminal Form GULL WING
Terminal Position DUAL
Transistor Application SWITCHING
Transistor Element Material SILICON
Turn-off Time-Max (toff) 70 ns
Turn-on Time-Max (ton) 40 ns

NDT3055L Related Parts

NDT3055L Frequently Asked Questions (FAQ)

  • The recommended PCB layout for optimal thermal performance involves placing a thermal pad on the bottom of the package, using a minimum of 2oz copper thickness, and ensuring good thermal conduction to the surrounding copper area. A thermal via array can also be used to improve heat dissipation.

  • To ensure reliable operation at high temperatures, it is essential to follow the recommended operating conditions, including junction temperature (Tj) and ambient temperature (Ta). Additionally, consider using a heat sink, thermal interface material, and ensuring good airflow around the device.

  • To prevent damage, handle the device by the body and avoid touching the leads or pins. Store the device in a dry, cool place, away from direct sunlight and moisture. Use anti-static packaging and follow ESD precautions when handling the device.

  • While the NDT3055L is a general-purpose device, it may not meet the specific requirements for high-reliability or automotive applications. National Semiconductor Corporation offers other devices that are specifically designed and qualified for these applications, such as the Automotive Grade or High-Reliability versions.

  • To troubleshoot common issues, start by checking the device's operating conditions, including voltage, current, and temperature. Verify that the device is properly soldered and that there are no signs of physical damage. Use a thermal camera or thermometer to check for overheating, and consult the datasheet and application notes for guidance on troubleshooting specific issues.

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