Datasheets
BLF647,112 by: NXP Semiconductors

BLF647

Part Details for BLF647,112 by NXP Semiconductors

Results Overview of BLF647,112 by NXP Semiconductors

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Applications Consumer Electronics

BLF647,112 Information

BLF647,112 by NXP Semiconductors is an RF Power Field-Effect Transistor.
RF Power Field-Effect Transistors are under the broader part category of Transistors.

A transistor is a small semiconductor device used to amplify, control, or create electrical signals. When selecting a transistor, factors such as voltage, current rating, gain, and power dissipation must be considered, with common types. Read more about Transistors on our Transistors part category page.

Price & Stock for BLF647,112

Part # Distributor Description Stock Price Buy
DISTI # 70R2868
Newark Mosfet, Rf, N Channel, 65V, 18A, Sot-540A-5, Drain Source Voltage Vds:65V, Continuous Drain Current Id:18A, Power Dissipation:290W, Operating Frequency Min:-, Operating Frequency Max:600Mhz, No. Of Pins:5Pins, Channel Type:N Channel Rohs Compliant: Yes |Nxp BLF647,112 RoHS: Compliant Min Qty: 60 Package Multiple: 1 Date Code: 0 Container: Bulk 0
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Part Details for BLF647,112

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BLF647,112 Part Data Attributes

BLF647,112 NXP Semiconductors
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BLF647,112 NXP Semiconductors BLF647
Rohs Code Yes
Part Life Cycle Code Obsolete
Ihs Manufacturer NXP SEMICONDUCTORS
Part Package Code SOT
Pin Count 2
Manufacturer Package Code SOT540A
Reach Compliance Code unknown
ECCN Code EAR99
HTS Code 8541.29.00.75
Case Connection SOURCE
Configuration COMMON SOURCE, 2 ELEMENTS
DS Breakdown Voltage-Min 65 V
Drain Current-Max (ID) 18 A
FET Technology METAL-OXIDE SEMICONDUCTOR
Highest Frequency Band ULTRA HIGH FREQUENCY BAND
JESD-30 Code R-CDFM-F4
Number of Elements 2
Number of Terminals 4
Operating Mode ENHANCEMENT MODE
Operating Temperature-Max 200 °C
Package Body Material CERAMIC, METAL-SEALED COFIRED
Package Shape RECTANGULAR
Package Style FLANGE MOUNT
Peak Reflow Temperature (Cel) NOT SPECIFIED
Polarity/Channel Type N-CHANNEL
Power Dissipation-Max (Abs) 290 W
Qualification Status Not Qualified
Surface Mount YES
Terminal Form FLAT
Terminal Position DUAL
Time@Peak Reflow Temperature-Max (s) NOT SPECIFIED
Transistor Application AMPLIFIER
Transistor Element Material SILICON

Alternate Parts for BLF647,112

This table gives cross-reference parts and alternative options found for BLF647,112. The Form Fit Function (FFF) tab will give you the options that are more likely to serve as direct pin-to-pin alternates or drop-in parts. The Functional Equivalents tab will give you options that are likely to match the same function of BLF647,112, but it may not fit your design. Always verify details of parts you are evaluating, as these parts are offered as suggestions for what you are looking for and are not guaranteed.

Part Number Manufacturer Composite Price Description Compare
BLF647 NXP Semiconductors Check for Price TRANSISTOR 2 CHANNEL, UHF BAND, Si, N-CHANNEL, RF POWER, MOSFET, FET RF Power BLF647,112 vs BLF647
934056498112 NXP Semiconductors Check for Price TRANSISTOR 2 CHANNEL, UHF BAND, Si, N-CHANNEL, RF POWER, MOSFET, CERAMIC, LDMOST, 4 PIN, FET RF Power BLF647,112 vs 934056498112

BLF647,112 Related Parts

BLF647,112 Frequently Asked Questions (FAQ)

  • The maximum operating frequency of the BLF647,112 is 3.8 GHz, but it can be optimized for higher frequencies with proper tuning and layout.

  • To optimize biasing, use a combination of voltage and current sensing to ensure the device operates within the recommended operating range. Consult the application note AN11561 for more information.

  • Use a 4-layer PCB with a solid ground plane, and ensure good thermal conductivity by using thermal vias and a heat sink. Refer to the application note AN11561 for detailed layout guidelines.

  • Yes, the BLF647,112 can be used in a push-pull configuration, but it requires careful design and layout to ensure proper operation and minimize electromagnetic interference (EMI).

  • Use ESD protection devices, such as diodes or resistors, in the circuit design, and follow proper handling and storage procedures to prevent ESD damage.

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