Datasheets
BUK9832-55A/CUX by:

N-channel TrenchMOS logic level FET SC-73 4-Pin

Part Details for BUK9832-55A/CUX by NXP Semiconductors

Results Overview of BUK9832-55A/CUX by NXP Semiconductors

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BUK9832-55A/CUX Information

BUK9832-55A/CUX by NXP Semiconductors is a Power Field-Effect Transistor.
Power Field-Effect Transistors are under the broader part category of Transistors.

A transistor is a small semiconductor device used to amplify, control, or create electrical signals. When selecting a transistor, factors such as voltage, current rating, gain, and power dissipation must be considered, with common types. Read more about Transistors on our Transistors part category page.

Price & Stock for BUK9832-55A/CUX

Part # Distributor Description Stock Price Buy
Quest Components POWER FIELD-EFFECT TRANSISTOR, 12A I(D), 50V, 0.036OHM, 1-ELEMENT, N-CHANNEL, SILICON, METAL-OXIDE SEMICONDUCTOR FET 232
  • 1 $1.0800
  • 18 $0.6480
  • 78 $0.5040
$0.5040 / $1.0800 Buy Now
Quest Components POWER FIELD-EFFECT TRANSISTOR, 12A I(D), 50V, 0.036OHM, 1-ELEMENT, N-CHANNEL, SILICON, METAL-OXIDE SEMICONDUCTOR FET 135
  • 1 $1.8000
  • 15 $1.0800
  • 57 $0.9000
$0.9000 / $1.8000 Buy Now
Quest Components POWER FIELD-EFFECT TRANSISTOR, 12A I(D), 50V, 0.036OHM, 1-ELEMENT, N-CHANNEL, SILICON, METAL-OXIDE SEMICONDUCTOR FET 118
  • 1 $0.7700
  • 7 $0.6160
  • 33 $0.3850
$0.3850 / $0.7700 Buy Now
NexGen Digital   2
RFQ
Win Source Electronics MOSFET N-CH 55V 12A SOT223 14042
  • 135 $0.4412
  • 280 $0.4135
  • 435 $0.3985
  • 625 $0.3708
  • 815 $0.3557
  • 1,015 $0.3419
$0.3419 / $0.4412 Buy Now

Part Details for BUK9832-55A/CUX

BUK9832-55A/CUX CAD Models

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BUK9832-55A/CUX Part Data Attributes

BUK9832-55A/CUX NXP Semiconductors
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BUK9832-55A/CUX NXP Semiconductors N-channel TrenchMOS logic level FET SC-73 4-Pin
Rohs Code Yes
Part Life Cycle Code Transferred
Ihs Manufacturer NXP SEMICONDUCTORS
Part Package Code SC-73
Package Description ROHS COMPLIANT, PLASTIC, SC-73, 4 PIN
Pin Count 4
Manufacturer Package Code SOT223
Reach Compliance Code unknown
ECCN Code EAR99
Avalanche Energy Rating (Eas) 100 mJ
Case Connection DRAIN
Configuration SINGLE WITH BUILT-IN DIODE
DS Breakdown Voltage-Min 55 V
Drain Current-Max (ID) 12 A
Drain-source On Resistance-Max 0.036 Ω
FET Technology METAL-OXIDE SEMICONDUCTOR
JESD-30 Code R-PDSO-G4
Number of Elements 1
Number of Terminals 4
Operating Mode ENHANCEMENT MODE
Package Body Material PLASTIC/EPOXY
Package Shape RECTANGULAR
Package Style SMALL OUTLINE
Peak Reflow Temperature (Cel) NOT SPECIFIED
Polarity/Channel Type N-CHANNEL
Pulsed Drain Current-Max (IDM) 47 A
Reference Standard AEC-Q101; IEC-60134
Surface Mount YES
Terminal Form GULL WING
Terminal Position DUAL
Time@Peak Reflow Temperature-Max (s) NOT SPECIFIED
Transistor Application SWITCHING
Transistor Element Material SILICON

BUK9832-55A/CUX Related Parts

BUK9832-55A/CUX Frequently Asked Questions (FAQ)

  • A good PCB layout for the BUK9832-55A/CUX should include a large copper area for heat dissipation, with multiple vias connecting the top and bottom layers. A thermal pad on the bottom of the package should be connected to a large copper area on the PCB.

  • To ensure reliable operation at high temperatures, it's essential to follow the recommended thermal design guidelines, including a proper heat sink design, and to ensure that the device is operated within its specified temperature range.

  • When selecting a heat sink for the BUK9832-55A/CUX, critical parameters to consider include the thermal resistance, material, and size of the heat sink, as well as the thermal interface material (TIM) used to connect the device to the heat sink.

  • To protect the BUK9832-55A/CUX from EOS and ESD, it's essential to follow proper handling and assembly procedures, including the use of ESD-safe materials and equipment, and to ensure that the device is properly connected to a ground plane.

  • The recommended soldering conditions for the BUK9832-55A/CUX include a peak temperature of 260°C, a soldering time of 10-30 seconds, and a temperature ramp-up rate of 3°C/second.

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